Other Seminar

Cutset Image Sampling -- Reconstruction, Compression and More

David Neuhoff

University of Michigan - Department of EECS
Friday, November 02, 2012
12:30pm - 1:30pm
1311 EECS

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EECS 500 seminar

About the Event

Cutset image sampling is a new approach in which a two-dimensional field, e.g. an image, is sampled densely along a grid of lines, e.g. a Manhattan grid, instead of the conventional uniformly spaced samples, as in rectangular or hexagonal sampling. It is useful in situations where edge image information must be preserved, and where samples are taken by a boat, airplane or land vehicle, or by a wired or wireless sensor network. In the latter cases, the closer spacing of adjacent sensors in cutset sampling requires less wire or energy than conventional sampling for communication among sensors. It is also useful as a first step in image compression, where the closer spacing of samples increases their correlation and compressibility. This talk introduces cutset sampling, as well as recent results on reconstructing nonbandlimited images from cutset samples, a sampling theorem for cross-bandlimited images, and lossless and lossy image compression methods based on cutset sampling.

Additional Information

Contact: Ann Pace

Phone: 763-5022


Sponsor(s): University of Michigan

Open to: Public