Electrical Engineering and Computer Science

EECS 500 Seminar

Cutset Image Sampling -- for Reconstruction, Compression and More

David Neuhoff

Professor
University of Michigan - Department of EECS
 
Friday, September 20, 2013
12:30pm - 1:30pm
1311 EECS

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About the Event

Cutset image sampling is a new approach in which a two-dimensional field, e.g. an image, is sampled densely along a grid of lines, e.g. a Manhattan grid, instead of the conventional uniformly spaced samples, as in rectangular or hexagonal sampling. It is useful in situations where edge image information must be preserved, and where samples are taken by a boat, airplane or land vehicle, or by a wired or wireless sensor network. In the latter cases, the closer spacing of adjacent sensors in cutset sampling requires less wire or energy than conventional sampling for intersensor communication. It is also useful as a first step in image compression, where the closer spacing of samples increases their correlation and compressibility. This talk introduces cutset sampling, as well as image reconstruction methods and a sampling theorem for cutset samples, lossless and lossy image compression methods based on cutset sampling, and source localization with a network of sensors arrayed in a cutset deployment.

Additional Information

Contact: Ann Pace

Phone: 763-5022

Email: ampace@umich.edu

Sponsor: University of Michigan, Department of Electrical Engineering & Computer Science

Open to: Public